modelNMOS
Spice-style NMOS transistor in bond graph technology
Information
The Spice-style n-channel MOSFET model contains the internal MOSFET plus the three external gate capacitances and the drain and source resistances.
Parameters:
Level: MOSFET modeling level (default value = 3)
Level=0: Static injection model
Level=1: Shichman-Hodges model
Level=2: Grove-Frohman model
Level=3: Empirical model
Level=4: Simplified Grove-Frohman model
Basic Geometric Parameters:
L: Channel length (default value = 1e-4 m) Levels 0-4
W: Channel width (default value = 1e-4 m) Levels 0-4
Basic Process Parameters:
TPG: Type of gate material (default value = 1) Levels 0-4
TPG = 0: Aluminum gate
TPG = 1: Polysilicon gate
TOX: Thin oxide thickness (default value = 1e-7 m) Levels 0-4
COX: Specific capacitance of SiO2 (default value = 0 F/m2) Levels 0-4
NSUB: Substrate doping (default value = 0 1/m3) Levels 0-4
Basic Electrical Parameters:
U0: Surface mobility at reference temperature (default value = 0 m2/(V*s)) Levels 0-4
VT0: Zero-bias threshold voltage (default value = 0 Volt) Levels 0,1
VT0 > 0 for enhancement MOSFET
VT0 < 0 for depletion MOSFET
LAMBDA: Channel length modulation (default value = 0 1/Volt) Levels 0-4
LD: Lateral diffusion (default value = 0 m) Levels 0-4
WD: Width diffusion (default value = 0 m) Levels 0-4
KP: Transconductance parameter at reference temperature (default value = 0 Amp/Volt2) Levels 0-4
GAMMA: Body-effect parameter (default value = 0 Volt0.5) Levels 0-4
PHI: Surface inversion potential at reference temperature (default value = 0 Volt) Levels 0-4
NSS: Surface state density (default value = 0 1/m2) Levels 0-4
Basic Temperature Compensation Parameters:
Tnom: Reference temperature (default value = 300.15 K) Levels 0-4
EG: Energy gap for temperature effect on saturation current at 0 K (default value = 1.11 Volt) Levels 0-4
Level=1 Electrical Parameters:
AD: Drain diffusion area (default value = 0 m2) Levels 1-4
PD: Drain perimeter width (default value = 0 m) Levels 1-4
AS: Source diffusion area (default value = 0 m2) Levels 1-4
PS: Source perimeter width (default value = 0 m) Levels 1-4
ISD: Drain junction saturation current at reference temperature (default value = 0 Amp) Levels 1-4
ISS: Source junction saturation current at reference temperature (default value = 0 Amp) Levels 1-4
JS: Transport saturation current density (default value = 0 Amp/m2) Levels 1-4
PB: Built-in potential at reference temperature (default value = 0.8 Volt) Levels 1-4
Level=1 Parasitic Resistor Parameters:
RD: Drain Ohmic resistance (default value = 1 Ohm) Levels 1-4
RS: Source Ohmic resistance (default value = 1 Ohm) Levels 1-4
Level=1 Junction Capacitance Parameters:
CJ: Zero-bias bulk capacitance per square meter at reference temperature (default value = 0 F/m2) Levels 1-4
MJ: Bulk junction grading coefficient (default value = 0.33) Levels 1-4
CJSW: Zero-bias perimeter capacitance per meter at reference temperature (default value = 1e-9 F/m) Levels 1-4
MJSW: Perimeter capacitance grading coefficient (default value = 0.33) Levels 1-4
FC: Forward-bias depletion capacitance coefficient (default value = 0.5) Levels 1-4
CGB0: Gate-bulk overlap capacitance per meter (default value = 0 F/m) Levels 1-4
CGD0: Gate-drain overlap capacitance per meter (default value = 0 F/m) Levels 1-4
CGS0: Gate-source overlap capacitance per meter (default value = 0 F/m) Levels 1-4
Level=1 Temperature Compensation Parameters:
TRD1: Linear temperature coefficient of drain resistance (default value = 0 1/K) Levels 1-4
TRD2: Quadratic temperature coefficient of drain resistance (default value = 0 1/K2) Levels 1-4
TRS1: Linear temperature coefficient of source resistance (default value = 0 1/K) Levels 1-4
TRS2: Quadratic temperature coefficient of source resistance (default value = 0 1/K2) Levels 1-4
Level=2 Process Parameters:
XJ: Metallurgical Junction Depth (default value = 0 m) Levels 2-4
Level=2 Electrical Parameters:
UCRIT: Critical electric field for mobility (default value = 1e6 V/m) Levels 2,4
UEXP: Exponential coefficient for mobility (default value = 0) Levels 2,4
UTRA: Transverse field coefficient (default value = 0) Levels 2,4
ECRIT: Critical electric field for pinch-off (default value = 0 V/m) Levels 2,4
DELTA: Width effect on threshold voltage (default value = 0) Levels 2-4
VMAX: Maximum drift velocity of carriers (default value = 0 m/s) Levels 2-4
VMAX = 0: Frohman-Grove model of drain current computation (Levels 2,4)
VMAX > 0: Baum-Beneking model of drain current computation (Levels 2,4)
NFS: Surface fast state density (default value = 0 1/m2) Levels 2-4
NEFF: Total channel charge coefficient (default value = 1) Levels 2,4
XQC: Coefficient of channel charge share (default value = 0) Levels 2-4
XQC <= 0.5: Ward-Dutton model of gate capacitance computation
XQC > 0.5: Meyer model of gate capacitance computation
Level=3 Electrical Parameters:
KAPPA: Saturation field factor (default value = 0.2) Level 3
ETA: Static feedback on threshold voltage (default value = 0) Level 3
THETA: Mobility modulation (default value = 0 1/Volt) Level 3
Numerical Parameters:
EMin: if x < EMin, the exp(x) function is linearized (default value = -100) Levels 1-4
EMax: if x > EMax, the exp(x) function is linearized (default value = 40) Levels 1-4
GminDC: Leakage conductance (default value = 1e-12 mho) Levels 0-4
References:
- Cellier, F.E. (1991), Continuous System Modeling, Springer-Verlag, New York.
- Massobrio, G. and P. Antognetti (1993), Semiconductor Device Modeling with Spice, 2nd edition, McGraw Hill, New York.
Parameters
| Type | Name | Default | Description |
|---|---|---|---|
| Real | pi | Modelica.Constants.pi | |
| Modelica.SIunits.Entropy | k | Modelica.Constants.k | Boltzmann's constant |
| Modelica.SIunits.Permittivity | e0 | Modelica.Constants.epsilon_0 | Permittivity of free space |
| Modelica.SIunits.ElectricCharge | q | 1.6021892e-19 | Electron charge |
| Modelica.SIunits.ElectronNumberDensity | ni | 1.45e16 | Intrinsic carrier concentration at 300 K |
| Real | kox | 3.9 | Dielectric constant of SiO2 |
| Real | ks | 11.8 | Dielectric constant of Si |
| Real | GapC1 | 7.02E-4 | Sze's first bandgap correction factor Silicon |
| Modelica.SIunits.Temperature | GapC2 | 1108.0 | Sze's second bandgap correction factor Silicon |
| Modelica.SIunits.Voltage | Fn0 | 3.25 | Work function constant for computation of flat band voltage |
| Modelica.SIunits.Length | TOXdef | 1e-7 | Default oxide thickness |
| Integer | Level | 1 | Level of MOSFET model |
| Geometric parameters | |||
| Modelica.SIunits.Length | L | 1e-4 | Channel length |
| Modelica.SIunits.Length | W | 1e-4 | Channel width |
| Process parameters | |||
| Real | TPG | 1 | Type of gate material |
| Modelica.SIunits.Length | TOX | TOXdef | Thin oxide thickness |
| Real | COX | 0 | Specific capacitance of SiO2 |
| Modelica.SIunits.ElectronNumberDensity | NSUB | 0 | Substrate doping |
| Electrical parameters | |||
| Real | U0 | 0 | Surface mobility at reference temperature |
| Modelica.SIunits.Voltage | VT0 | 0 | Zero-bias threshold voltage (VT0>0: enhancement type, VT0<0: depletion type) |
| Modelica.SIunits.InversePotential | LAMBDA | 0 | Channel length modulation |
| Modelica.SIunits.Length | LD | 0 | Lateral diffusion |
| Modelica.SIunits.Length | WD | 0 | Width diffusion |
| Modelica.SIunits.Transconductance | KP | 0 | Transconductance parameter at reference temperature |
| Real | GAMMA | 0 | Body-effect parameter |
| Modelica.SIunits.Voltage | PHI | 0 | Surface inversion potential at reference temperature |
| Real | NSS | 0 | Surface state density |
| Temperature compensation parameters | |||
| Modelica.SIunits.Temperature | Tnom | 300.15 | Reference temperature |
| Modelica.SIunits.Voltage | EG | 1.11 | Energy gap for temperature effect on saturation current at 0 K |
| Level=1 › Electrical parameters | |||
| Modelica.SIunits.Area | AD | 0 | Drain diffusion area |
| Modelica.SIunits.Length | PD | 0 | Drain perimeter width |
| Modelica.SIunits.Area | AS | 0 | Source diffusion area |
| Modelica.SIunits.Length | PS | 0 | Source perimeter width |
| Modelica.SIunits.Current | ISD | 0 | Drain junction saturation current at reference temperature |
| Modelica.SIunits.Current | ISS | 0 | Source junction saturation current at reference temperature |
| Modelica.SIunits.CurrentDensity | JS | 0 | Saturation current density at reference temperature |
| Modelica.SIunits.Voltage | PB | 0.8 | Built-in potential at reference temperature |
| Level=1 › Parasitic resistance parameters | |||
| Modelica.SIunits.Resistance | RD | 0.1 | Drain Ohmic resistance |
| Modelica.SIunits.Resistance | RS | 0.1 | Source Ohmic resistance |
| Level=1 › Junction capacitance parameters | |||
| Real | CJ | 0 | Zero-bias bulk capacitance per square meter at reference temperature |
| Real | MJ | 0.33 | Bulk junction grading coefficient |
| Real | CJSW | 1e-9 | Zero-bias perimeter capacitance per meter at reference temperature |
| Real | MJSW | 0.33 | Perimeter capacitance grading coefficient |
| Real | FC | 0.5 | Forward-bias depletion capacitance coefficient |
| Real | CGB0 | 0 | Gate-bulk overlap capacitance per meter |
| Real | CGD0 | 0 | Gate-drain overlap capacitance per meter |
| Real | CGS0 | 0 | Gate-source overlap capacitance per meter |
| Level=1 › Temperature compensation parameters | |||
| Real | TRD1 | 0 | Linear temperature coefficient of drain resistance |
| Real | TRD2 | 0 | Quadratic temperature coefficient of drain resistance |
| Real | TRS1 | 0 | Linear temperature coefficient of source resistance |
| Real | TRS2 | 0 | Quadratic temperature coefficient of source resistance |
| Level=2 › Process parameters | |||
| Modelica.SIunits.Length | XJ | 0 | Metallurgical junction depth |
| Level=2 › Electrical parameters | |||
| Modelica.SIunits.ElectricFieldStrength | UCRIT | 1e6 | Critical electric field for mobility |
| Real | UEXP | 0 | Exponential coefficient for mobility |
| Real | UTRA | 0 | Transverse field coefficient |
| Modelica.SIunits.ElectricFieldStrength | ECRIT | 0 | Critical electric field for pinch-off |
| Real | DELTA | 0 | Width effect on threshold voltage |
| Modelica.SIunits.Velocity | VMAX | 0 | Maximum drift velocity of carriers (VMAX=0: Frohman-Grove model, VMAX>0: Baum-Beneking model) |
| Real | NFS | 0 | Surface fast state density |
| Real | NEFF | 1 | Total channel charge coefficient |
| Real | XQC | 0 | Coefficient of channel charge share (XQC<=0.5: Ward-Dutton model, XQC>0.5: Meyer model) |
| Level=3 › Electrical parameters | |||
| Real | KAPPA | 0.2 | Saturation field factor |
| Real | ETA | 0 | Static feedback on threshold voltage |
| Modelica.SIunits.InversePotential | THETA | 0 | Mobility modulation |
| Advanced › Numerical parameters | |||
| Real | EMin | -100 | if x < EMin, the exp(x) function is linearized |
| Real | EMax | 40 | if x > EMax, the exp(x) function is linearized |
| Modelica.SIunits.Conductance | GminDC | 1e-12 | Leakage conductance |
Connectors
| Type | Name | Default | Description |
|---|---|---|---|
| BondLib.Interfaces.BondCon | G | Gate | |
| BondLib.Interfaces.BondCon | D | Drain | |
| BondLib.Interfaces.BondCon | B | Bulk | |
| BondLib.Interfaces.BondCon | S | Source | |
| BondLib.Interfaces.BondCon | H | Heat |