modelPMOS

Spice-style PMOS transistor in bond graph technology

Information

The Spice-style p-channel MOSFET model contains the internal MOSFET plus the three external gate capacitances and the drain and source resistances.


Parameters:

 Level:   MOSFET modeling level (default value = 3)
            Level=0: Static injection model
            Level=1: Shichman-Hodges model
            Level=2: Grove-Frohman model
            Level=3: Empirical model
            Level=4: Simplified Grove-Frohman model


Basic Geometric Parameters:

 L:       Channel length (default value = 1e-4 m) Levels 0-4

 W:       Channel width (default value = 1e-4 m) Levels 0-4


Basic Process Parameters:

 TPG:     Type of gate material (default value = 1) Levels 0-4
            TPG = 0:  Aluminum gate
            TPG = 1:  Polysilicon gate

 TOX:     Thin oxide thickness (default value = 1e-7 m) Levels 0-4

 COX:     Specific capacitance of SiO2 (default value = 0 F/m2) Levels 0-4

 NSUB:    Substrate doping (default value = 0 1/m3) Levels 0-4


Basic Electrical Parameters:

 U0:      Surface mobility at reference temperature (default value = 0 m2/(V*s)) Levels 0-4

 VT0:     Zero-bias threshold voltage (default value = 0 Volt) Levels 0,1
            VT0 < 0 for enhancement MOSFET
            VT0 > 0 for depletion MOSFET

 LAMBDA:  Channel length modulation  (default value = 0 1/Volt) Levels 0-4

 LD:      Lateral diffusion (default value = 0 m) Levels 0-4

 WD:      Width diffusion (default value = 0 m) Levels 0-4

 KP:      Transconductance parameter at reference temperature (default value = 0 Amp/Volt2) Levels 0-4

 GAMMA:   Body-effect parameter (default value = 0 Volt0.5) Levels 0-4

 PHI:     Surface inversion potential at reference temperature (default value = 0 Volt) Levels 0-4

 NSS:     Surface state density (default value = 0 1/m2) Levels 0-4


Basic Temperature Compensation Parameters:

 Tnom:    Reference temperature (default value = 300.15 K) Levels 0-4

 EG:      Energy gap for temperature effect on saturation current at 0 K (default value = 1.11 Volt) Levels 0-4


Level=1 Electrical Parameters:

 AD:      Drain diffusion area (default value = 0 m2) Levels 1-4

 PD:      Drain perimeter width (default value = 0 m) Levels 1-4

 AS:      Source diffusion area (default value = 0 m2) Levels 1-4

 PS:      Source perimeter width (default value = 0 m) Levels 1-4

 ISD:     Drain junction saturation current at reference temperature (default value = 0 Amp) Levels 1-4

 ISS:     Source junction saturation current at reference temperature (default value = 0 Amp) Levels 1-4

 JS:      Transport saturation current density (default value = 0 Amp/m2) Levels 1-4

 PB:      Built-in potential at reference temperature (default value = 0.8 Volt) Levels 1-4


Level=1 Parasitic Resistor Parameters:

 RD:      Drain Ohmic resistance (default value = 1 Ohm) Levels 1-4

 RS:      Source Ohmic resistance (default value = 1 Ohm) Levels 1-4


Level=1 Junction Capacitance Parameters:

 CJ:      Zero-bias bulk capacitance per square meter at reference temperature (default value = 0 F/m2) Levels 1-4

 MJ:      Bulk junction grading coefficient (default value = 0.33) Levels 1-4

 CJSW:    Zero-bias perimeter capacitance per meter at reference temperature (default value = 1e-9 F/m) Levels 1-4

 MJSW:    Perimeter capacitance grading coefficient (default value = 0.33) Levels 1-4

 FC:      Forward-bias depletion capacitance coefficient (default value = 0.5) Levels 1-4

 CGB0:    Gate-bulk overlap capacitance per meter (default value = 0 F/m) Levels 1-4

 CGD0:    Gate-drain overlap capacitance per meter (default value = 0 F/m) Levels 1-4

 CGS0:    Gate-source overlap capacitance per meter (default value = 0 F/m) Levels 1-4


Level=1 Temperature Compensation Parameters:

 TRD1:    Linear temperature coefficient of drain resistance (default value = 0 1/K) Levels 1-4

 TRD2:    Quadratic temperature coefficient of drain resistance (default value = 0 1/K2) Levels 1-4

 TRS1:    Linear temperature coefficient of source resistance (default value = 0 1/K) Levels 1-4

 TRS2:    Quadratic temperature coefficient of source resistance (default value = 0 1/K2) Levels 1-4


Level=2 Process Parameters:

 XJ:      Metallurgical Junction Depth (default value = 0 m) Levels 2-4


Level=2 Electrical Parameters:

 UCRIT:   Critical electric field for mobility (default value = 1e6 V/m) Levels 2,4

 UEXP:    Exponential coefficient for mobility (default value = 0) Levels 2,4

 UTRA:    Transverse field coefficient (default value = 0) Levels 2,4

 ECRIT:   Critical electric field for pinch-off (default value = 0 V/m) Levels 2,4

 DELTA:   Width effect on threshold voltage (default value = 0) Levels 2-4

 VMAX:    Maximum drift velocity of carriers (default value = 0 m/s) Levels 2-4
            VMAX = 0: Frohman-Grove model of drain current computation (Levels 2,4)
            VMAX > 0: Baum-Beneking model of drain current computation (Levels 2,4)

 NFS:     Surface fast state density (default value = 0 1/m2) Levels 2-4

 NEFF:    Total channel charge coefficient (default value = 1) Levels 2,4

 XQC:     Coefficient of channel charge share (default value = 0) Levels 2-4
            XQC <= 0.5: Ward-Dutton model of gate capacitance computation
            XQC >  0.5: Meyer model of gate capacitance computation


Level=3 Electrical Parameters:

 KAPPA:   Saturation field factor (default value = 0.2) Level 3

 ETA:     Static feedback on threshold voltage (default value = 0) Level 3

 THETA:   Mobility modulation (default value = 0 1/Volt) Level 3


Numerical Parameters:

 EMin:    if x < EMin, the exp(x) function is linearized (default value = -100) Levels 1-4

 EMax:    if x > EMax, the exp(x) function is linearized (default value = 40) Levels 1-4

 GminDC:  Leakage conductance (default value = 1e-12 mho) Levels 0-4


References:

  1. Cellier, F.E. (1991), Continuous System Modeling, Springer-Verlag, New York.
  2. Massobrio, G. and P. Antognetti (1993), Semiconductor Device Modeling with Spice, 2nd edition, McGraw Hill, New York.

Parameters

TypeNameDefaultDescription
RealpiModelica.Constants.pi
Modelica.SIunits.EntropykModelica.Constants.kBoltzmann's constant
Modelica.SIunits.Permittivitye0Modelica.Constants.epsilon_0Permittivity of free space
Modelica.SIunits.ElectricChargeq1.6021892e-19Electron charge
Modelica.SIunits.ElectronNumberDensityni1.45e16Intrinsic carrier concentration at 300 K
Realkox3.9Dielectric constant of SiO2
Realks11.8Dielectric constant of Si
RealGapC17.02E-4Sze's first bandgap correction factor Silicon
Modelica.SIunits.TemperatureGapC21108.0Sze's second bandgap correction factor Silicon
Modelica.SIunits.VoltageFn03.25Work function constant for computation of flat band voltage
Modelica.SIunits.LengthTOXdef1e-7Default oxide thickness
IntegerLevel1Level of MOSFET model
Geometric parameters
Modelica.SIunits.LengthL1e-4Channel length
Modelica.SIunits.LengthW1e-4Channel width
Process parameters
RealTPG1Type of gate material
Modelica.SIunits.LengthTOXTOXdefThin oxide thickness
RealCOX0Specific capacitance of SiO2
Modelica.SIunits.ElectronNumberDensityNSUB0Substrate doping
Electrical parameters
RealU00Surface mobility at reference temperature
Modelica.SIunits.VoltageVT00Zero-bias threshold voltage (VT0<0: enhancement type, VT0>0: depletion type)
Modelica.SIunits.InversePotentialLAMBDA0Channel length modulation
Modelica.SIunits.LengthLD0Lateral diffusion
Modelica.SIunits.LengthWD0Width diffusion
Modelica.SIunits.TransconductanceKP0Transconductance parameter at reference temperature
RealGAMMA0Body-effect parameter
Modelica.SIunits.VoltagePHI0Surface inversion potential at reference temperature
RealNSS0Surface state density
Temperature compensation parameters
Modelica.SIunits.TemperatureTnom300.15Reference temperature
Modelica.SIunits.VoltageEG1.11Energy gap for temperature effect on saturation current at 0 K
Level=1 › Electrical parameters
Modelica.SIunits.AreaAD0Drain diffusion area
Modelica.SIunits.LengthPD0Drain perimeter width
Modelica.SIunits.AreaAS0Source diffusion area
Modelica.SIunits.LengthPS0Source perimeter width
Modelica.SIunits.CurrentISD0Drain junction saturation current at reference temperature
Modelica.SIunits.CurrentISS0Source junction saturation current at reference temperature
Modelica.SIunits.CurrentDensityJS0Saturation current density at reference temperature
Modelica.SIunits.VoltagePB0.8Built-in potential at reference temperature
Level=1 › Parasitic resistance parameters
Modelica.SIunits.ResistanceRD0.1Drain Ohmic resistance
Modelica.SIunits.ResistanceRS0.1Source Ohmic resistance
Level=1 › Junction capacitance parameters
RealCJ0Zero-bias bulk capacitance per square meter at reference temperature
RealMJ0.33Bulk junction grading coefficient
RealCJSW1e-9Zero-bias perimeter capacitance per meter at reference temperature
RealMJSW0.33Perimeter capacitance grading coefficient
RealFC0.5Forward-bias depletion capacitance coefficient
RealCGB00Gate-bulk overlap capacitance per meter
RealCGD00Gate-drain overlap capacitance per meter
RealCGS00Gate-source overlap capacitance per meter
Level=1 › Temperature compensation parameters
RealTRD10Linear temperature coefficient of drain resistance
RealTRD20Quadratic temperature coefficient of drain resistance
RealTRS10Linear temperature coefficient of source resistance
RealTRS20Quadratic temperature coefficient of source resistance
Level=2 › Process parameters
Modelica.SIunits.LengthXJ0Metallurgical junction depth
Level=2 › Electrical parameters
Modelica.SIunits.ElectricFieldStrengthUCRIT1e6Critical electric field for mobility
RealUEXP0Exponential coefficient for mobility
RealUTRA0Transverse field coefficient
Modelica.SIunits.ElectricFieldStrengthECRIT0Critical electric field for pinch-off
RealDELTA0Width effect on threshold voltage
Modelica.SIunits.VelocityVMAX0Maximum drift velocity of carriers (VMAX=0: Frohman-Grove model, VMAX>0: Baum-Beneking model)
RealNFS0Surface fast state density
RealNEFF1Total channel charge coefficient
RealXQC0Coefficient of channel charge share (XQC<=0.5: Ward-Dutton model, XQC>0.5: Meyer model)
Level=3 › Electrical parameters
RealKAPPA0.2Saturation field factor
RealETA0Static feedback on threshold voltage
Modelica.SIunits.InversePotentialTHETA0Mobility modulation
Advanced › Numerical parameters
RealEMin-100if x < EMin, the exp(x) function is linearized
RealEMax40if x > EMax, the exp(x) function is linearized
Modelica.SIunits.ConductanceGminDC1e-12Leakage conductance

Connectors

TypeNameDefaultDescription
BondLib.Interfaces.BondConGGate
BondLib.Interfaces.BondConDDrain
BondLib.Interfaces.BondConBBulk
BondLib.Interfaces.BondConSSource
BondLib.Interfaces.BondConHHeat

Components

TypeNameDefaultDescription
BondLib.Junctions.J0p4J0p4_2
BondLib.Junctions.J0p4J0p4_1
BondLib.Bonds.BondB1
BondLib.Bonds.BondB2
BondLib.Bonds.BondB3
BondLib.Bonds.BondB4
BondLib.Junctions.J1p3J1p3_1
BondLib.Bonds.BondB5
BondLib.Junctions.J1p3J1p3_2
BondLib.Bonds.BondB6
BondLib.Bonds.BondB7
BondLib.Bonds.BondB8
BondLib.Spice.Utilities.RMRd
BondLib.Spice.Utilities.RMRs
BondLib.Bonds.BondB9
BondLib.Junctions.J1p3J1p3_3
BondLib.Bonds.BondB10
BondLib.Bonds.BondB11
BondLib.Spice.Utilities.CgdCdg
BondLib.Bonds.BondB12
BondLib.Junctions.J1p3J1p3_4
BondLib.Bonds.BondB13
BondLib.Bonds.BondB14
BondLib.Spice.Utilities.CgbCbg
BondLib.Junctions.J0p5J0p5_1
BondLib.Bonds.BondB15
BondLib.Junctions.J1p3J1p3_5
BondLib.Bonds.BondB16
BondLib.Bonds.fBondB17
BondLib.Sensors.DeVsb
BondLib.Bonds.BondB18
BondLib.Junctions.J1p3J1p3_6
BondLib.Bonds.BondB19
BondLib.Bonds.fBondB20
BondLib.Sensors.DeVsd
BondLib.Junctions.J0p5J0p5_2
BondLib.Bonds.BondB21
BondLib.Junctions.J1p3J1p3_7
BondLib.Bonds.BondB22
BondLib.Bonds.BondB23
BondLib.Spice.Utilities.CgsCsg
BondLib.Junctions.J0p6J0p6_1
BondLib.Bonds.eBondB24
BondLib.Bonds.eBondB25
BondLib.Bonds.eBondB26
BondLib.Bonds.eBondB27
BondLib.Bonds.eBondB28
BondLib.Bonds.eBondB29
BondLib.Junctions.J0p3J0p3_1
BondLib.Bonds.eBondB30
BondLib.Spice.Utilities.PMOSintPMOSint