modelCgd

Spice-style gate capacitance between gate and drain of MOSFETs

Extends from Interfaces.SpiceTwoPort (Special twoPort element used by Spice models).

Information

The Spice-style gate capacitances for MOSFETs are non-linear capacitors that use different formulae to compute the capacitance value in the four different regions: accumulation, depletion, saturation, and the linear region. Different Spice dialects vary in the formulae they use for this purpose. Many Spice dialects actually don't use a formula for the gate capacitances at all, but rather compute the electric charges stored in these regions directly, which is conceptually cleaner. However, that approach is computationally cumbersome, as it leads to an awkward algebraic loop [1]. Thus, we chose to compute the gate capacitances directly, and use a (physically incorrect) approximate non-linear capacitor model. The numerical error should remain small, as the time constants associated with temperature variation are much larger than those associated with electrical phenomena.

This particular model uses the space charge formula advocated in [2].


Parameters:

 Level:   MOSFET modeling level (default value = 3)
            Level=0: Static injection model
            Level=1: Shichman-Hodges model
            Level=2: Grove-Frohman model
            Level=3: Empirical model
            Level=4: Simplified Grove-Frohman model

 Type:    Type of MOSFET (default value = 1)
            Type = +1:  NMOS
            Type = -1:  PMOS

 Tnom:    Reference temperature (default value = 300.15 K)

 VFB:     Flat band voltage at reference temperature (default value = 0 Volt)

 KP:      Transconductance parameter at reference temperature (default value = 0 Amp/Volt2)

 GAMMA:   Body-effect parameter (default value = Volt0.5)

 PHI:     Surface inversion potential at reference temperature (default value = 0 Volt)

 COX:     Specific capacitance of SiO2 (default value = 0 F/m2)

 NFS:     Surface fast state density (default value = 0 1/m2)

 XJ:      Metallurgical junction depth (default value = 0 m)

 L:       Channel length (default value = 1e-4 m)

 W:       Channel width (default value = 1e-4 m)

 LD:      Lateral diffusion (default value = 0 m)

 XD:      Depletion factor (default value = 0 m/Volt0.5)

 XQC:     Coefficient of channel charge share (default value = 0)
            XQC <= 0.5: Ward-Dutton model of gate capacitance computation
            XQC >  0.5: Meyer model of gate capacitance computation

 DELTA:   Width effect on threshold voltage (default value = 0)

 ETA:     Static feedback on threshold voltage (default value = 1)

 CGD0:    Gate-drain overlap capacitance per meter (default value = 1e-12 F/m)

 EG:      Energy gap for temperature effect on saturation current (default value = 1.11 Volt)


References:

  1. Cellier, F.E. (1991), Continuous System Modeling, Springer-Verlag, New York, pp. 224-225.
  2. Massobrio, G. and P. Antognetti (1993), Semiconductor Device Modeling with Spice, 2nd edition, McGraw Hill, New York, pp.196-197.

Parameters

TypeNameDefaultDescription
Modelica.SIunits.TemperatureTnom (from SpiceTwoPort)300.15Reference temperature
RealpiModelica.Constants.pi
Modelica.SIunits.EntropykModelica.Constants.kBoltzmann's constant
Modelica.SIunits.Permittivitye0Modelica.Constants.epsilon_0Permittivity of free space
Modelica.SIunits.ElectricChargeq1.6021892e-19Electron charge
Modelica.SIunits.ElectronNumberDensityni1.45e16Intrinsic carrier concentration
Realks11.8Dielectric constant of Si
RealGapC17.02E-4First bandgap correction factor Silicon
Modelica.SIunits.TemperatureGapC21108.0Second bandgap correction factor Silicon
Realc00.0631353
Realc10.8013292
Realc2-0.01110777
IntegerLevel3Level of MOS model (check documentation window for details)
IntegerType1Type=1 for NMOS; Type=-1 for PMOS
Modelica.SIunits.VoltageVFB0Flat band voltage at reference temperature
Modelica.SIunits.TransconductanceKP0Transconductance parameter at reference temperature
RealGAMMA0Body-effect parameter
Modelica.SIunits.VoltagePHI0Surface inversion potential at reference temperature
RealCOX0Specific capacitance of SiO2
RealNFS0Surface fast state density
Modelica.SIunits.LengthXJ0Metallurgical junction depth
Modelica.SIunits.LengthL1e-4Channel length
Modelica.SIunits.LengthW1e-4Channel width
Modelica.SIunits.LengthLD0Lateral diffusion
RealXD0Depletion factor
RealXQC0Coefficient of channel charge share
RealDELTA0Width effect on threshold voltage
RealETA0Static feedback on threshold voltage
RealCGD01e-12Gate-drain overlap capacitance per meter
Modelica.SIunits.VoltageEG1.11Energy gap for temperature effect on saturation current at 0 K

Connectors

TypeNameDefaultDescription
BondLib.Interfaces.BondConBondCon1 (from TwoPort)Left bond graph connector
BondLib.Interfaces.BondConBondCon2 (from TwoPort)Right bond graph connector
Modelica.Blocks.Interfaces.RealInputu1Connector of Real input signal 1
Modelica.Blocks.Interfaces.RealInputu2Connector of Real input signal 2
Modelica.Blocks.Interfaces.RealInput[5]uConnector of Real input signals

Components

TypeNameDefaultDescription
Reale1 (from TwoPort)Bondgraphic primary effort
Realf1 (from TwoPort)Bondgraphic primary flow
Reale2 (from TwoPort)Bondgraphic secondary effort
Realf2 (from TwoPort)Bondgraphic secondary flow
Modelica.SIunits.TemperatureDTemp (from SpiceTwoPort)Difference between circuit temperature and reference temperature
RealDTempSq (from SpiceTwoPort)Square of DTemp
Modelica.SIunits.VoltagevdsDrain-source voltage
Modelica.SIunits.VoltagevgsGate-source voltage
Modelica.SIunits.VoltagevbsBulk-source voltage
Modelica.SIunits.VoltageVtThermal voltage
Modelica.SIunits.VoltageEGrefEnergy gap at reference temperature
Modelica.SIunits.VoltageEGvalEnergy gap at device temperature
Modelica.SIunits.VoltagePHIvalSurface inversion potential at device temperature
Modelica.SIunits.VoltageVfbFlat band voltage at device temperature
Modelica.SIunits.VoltageVthThreshold voltage
Modelica.SIunits.VoltageVonAdjusted threshold voltage
Modelica.SIunits.CapacitanceCvalGate capacitance between gate and bulk