modelCjM

Spice-style junction capacitor model for MOSFETs

Extends from BondLib.Interfaces.TwoPort (Partial model invoking two bondgraphic connectors).

Information

The Spice-style junction capacitance for MOSFETs computes the depletion capacitance value of a junction used in a MOSFET. Different Spice dialects vary in the formulae they use for this purpose. Many Spice dialects actually don't use a formula for the junction capacitance at all, but rather compute the electric charge stored in the junction directly, which is conceptually cleaner. However, that approach is computationally cumbersome, as it leads to an awkward algebraic loop [1]. Thus, we chose to compute the junction capacitance, and use a (physically incorrect) approximate non-linear capacitor model. The numerical error should remain small, as the time constants associated with temperature variation are much larger than those associated with electrical phenomena.


Parameters:

 Level:   MOSFET modeling level (default value = 3)
            Level=0: Static injection model
            Level=1: Shichman-Hodges model
            Level=2: Grove-Frohman model
            Level=3: Empirical model
            Level=4: Simplified Grove-Frohman model

 IS:      Transport saturation current (default value = 0 Amp)

 PB:      Built-in potential at reference temperature (default value = 0.8 Volt)

 CJ:      Zero-bias bulk capacitance per square meter at reference temperature (default value = 1e-4 F/m2)

 MJ:      Bulk junction grading coefficient (default value = 0.33)

 CJSW:    Zero-bias perimeter capacitance per meter at reference temperature (default value = 1e-9 F/m)

 MJSW:    Perimeter capacitance grading coefficient (default value = 0.33)

 FC:      Forward-bias depletion capacitance coefficient (default value = 0.5)

 A:       Diffusion area (default value = 0 m2)

 P:       Perimeter width (default value = 0 m)

 EG:      Energy gap for temperature effect on saturation current (default value = 1.11 Volt)

 GminDC:  Leakage conductance (default value = 1e-12 Mho)

 EMin:    if x < EMin, the exp(x) function is linearized (default value = -100)

 EMax:    if x > EMax, the exp(x) function is linearized (default value = 40)


References:

  1. Cellier, F.E. (1991), Continuous System Modeling, Springer-Verlag, New York, pp. 224-225.
  2. Massobrio, G. and P. Antognetti (1993), Semiconductor Device Modeling with Spice, 2nd edition, McGraw Hill, New York, p.200.

Parameters

TypeNameDefaultDescription
IntegerLevel3MOSFET modeling level (check documentation window for details)
Modelica.SIunits.TemperatureTnom300.15Reference temperature
Modelica.SIunits.CurrentIS0Saturation current at reference temperature
Modelica.SIunits.VoltagePB0.8Built-in potential at reference temperature
RealCJ1e-4Zero-bias bulk capacitance per square meter at reference temperature
RealMJ0.33Bulk junction grading coefficient
RealCJSW1e-9Zero-bias perimeter capacitance per meter at reference temperature
RealMJSW0.33Perimeter capacitance grading coefficient
RealFC0.5Forward-bias depletion capacitance coefficient
Modelica.SIunits.AreaA0Diffusion area
Modelica.SIunits.LengthP0Perimeter width
Modelica.SIunits.VoltageEG1.11Energy gap for temperature effect on saturation current at 300 K
Modelica.SIunits.ConductanceGminDC1e-12Leakage conductance
RealEMin-100if x < EMin, the exp(x) function is linearized
RealEMax40if x > EMax, the exp(x) function is linearized

Connectors

TypeNameDefaultDescription
BondLib.Interfaces.BondConBondCon1 (from TwoPort)Left bond graph connector
BondLib.Interfaces.BondConBondCon2 (from TwoPort)Right bond graph connector

Components

TypeNameDefaultDescription
Reale1 (from TwoPort)Bondgraphic primary effort
Realf1 (from TwoPort)Bondgraphic primary flow
Reale2 (from TwoPort)Bondgraphic secondary effort
Realf2 (from TwoPort)Bondgraphic secondary flow
Junctions.J0p5J0p5_1
Bonds.fBondB1
Sensors.Devd
Bonds.eBondB2
Semiconductors.Utilities.mC2Cj1
nlCMCval
Junctions.J0p4J0p4_1
Bonds.fBondB7
Sensors.DeTdev
DjMDjM1
Bonds.eBondB4
Bonds.fBondB3
Bonds.fBondB5
Bonds.eBondB6
RSRd