Parameters:
Level: MOSFET modeling level (default value = 3)
Level=0: Static injection model
Level=1: Shichman-Hodges model
Level=2: Grove-Frohman model
Level=3: Empirical model
Level=4: Simplified Grove-Frohman model
Tnom: Reference temperature (default value = 300.15 K)
VT0: Zero-bias threshold voltage (default value = 0 Volt)
VT0 > 0 for enhancement MOSFET
VT0 < 0 for depletion MOSFET
KP: Transconductance parameter at reference temperature (default value = 0 Amp/Volt2)
GAMMA: Body-effect parameter (default value = Volt0.5)
PHI: Surface inversion potential at reference temperature (default value = 0 Volt)
LAMBDA: Channel length modulation (default value = 0 1/Volt)
TOX: Thin oxide thickness (default value = 1e-7 m)
COX: Specific capacitance of SiO2 (default value = 0 F/m2)
NSUB: Substrate doping (default value = 0 1/m3)
NSS: Surface state density (default value = 0 1/m2)
NFS: Surface fast state density (default value = 0 1/m2)
NEFF: Total channel charge coefficient (default value = 1)
XJ: Metallurgical junction depth (default value = 0 m)
L: Channel length (default value = 1e-4 m)
W: Channel width (default value = 1e-4 m)
LD: Lateral diffusion (default value = 0 m)
AD: Drain diffusion area (default value = 0 m2)
PD: Drain perimeter width (default value = 0 m)
AS: Source diffusion area (default value = 0 m2)
PS: Source perimeter width (default value = 0 m)
XD: Depletion factor (default value = 0 m/Volt0.5)
TPG: Type of gate material (default value = 1)
U0: Surface mobility at reference temperature (default value = 0 m2/(V*s))
UCRIT: Critical electric field for mobility (default value = 1e6 V/m)
UEXP: Exponential coefficient for mobility (default value = 0)
UTRA: Transverse field coefficient (default value = 0)
VMAX: Maximum drift velocity of carriers (default value = 0 m/s)
VMAX = 0: Frohman-Grove model of drain current computation
VMAX > 0: Baum-Beneking model of drain current computation
ECRIT: Critical electric field for pinch-off (default value = 0 V/m) Levels 2,3
XQC: Coefficient of channel charge share (default value = 0) Levels 2,3
XQC <= 0.5: Ward-Dutton model of gate capacitance computation
XQC > 0.5: Meyer model of gate capacitance computation
DELTA: Width effect on threshold voltage (default value = 0)
KAPPA: Saturation field factor (default value = 0.2)
ETA: Static feedback on threshold voltage (default value = 0)
THETA: Mobility modulation (default value = 0 1/Volt)
VBP: Gate to channel critical voltage (default value = 0 Volt)
ISD: Drain junction saturation current at reference temperature (default value = 0 Amp)
ISS: Source junction saturation current at reference temperature (default value = 0 Amp)
PB: Built-in potential at reference temperature (default value = 0.8 Volt)
CJ: Zero-bias bulk capacitance per square meter at reference temperature (default value = 1e-4 F/m2)
MJ: Bulk junction grading coefficient (default value = 0.33)
CJSW: Zero-bias perimeter capacitance per meter at reference temperature (default value = 1e-9 F/m)
MJSW: Perimeter capacitance grading coefficient (default value = 0.33)
FC: Forward-bias depletion capacitance coefficient (default value = 0.5)
GminDC: Leakage conductance (default value = 1e-12 mho)
EG: Energy gap for temperature effect on saturation current (default value = 1.11 Volt)
EMin: if x < EMin, the exp(x) function is linearized (default value = -100)
EMax: if x > EMax, the exp(x) function is linearized (default value = 40)
References: