Parameters: Level: MOSFET modeling level (default value = 3) Level=0: Static injection model Level=1: Shichman-Hodges model Level=2: Grove-Frohman model Level=3: Empirical model Level=4: Simplified Grove-Frohman model Tnom: Reference temperature (default value = 300.15 K) VT0: Zero-bias threshold voltage (default value = 0 Volt) VT0 < 0 for enhancement MOSFET VT0 > 0 for depletion MOSFET KP: Transconductance parameter at reference temperature (default value = 0 Amp/Volt2) GAMMA: Body-effect parameter (default value = Volt0.5) PHI: Surface inversion potential at reference temperature (default value = 0 Volt) LAMBDA: Channel length modulation (default value = 0 1/Volt) TOX: Thin oxide thickness (default value = 1e-7 m) COX: Specific capacitance of SiO2 (default value = 0 F/m2) NSUB: Substrate doping (default value = 0 1/m3) NSS: Surface state density (default value = 0 1/m2) NFS: Surface fast state density (default value = 0 1/m2) NEFF: Total channel charge coefficient (default value = 1) XJ: Metallurgical junction depth (default value = 0 m) L: Channel length (default value = 1e-4 m) W: Channel width (default value = 1e-4 m) LD: Lateral diffusion (default value = 0 m) AD: Drain diffusion area (default value = 0 m2) PD: Drain perimeter width (default value = 0 m) AS: Source diffusion area (default value = 0 m2) PS: Source perimeter width (default value = 0 m) XD: Depletion factor (default value = 0 m/Volt0.5) TPG: Type of gate material (default value = 1) U0: Surface mobility at reference temperature (default value = 0 m2/(V*s)) UCRIT: Critical electric field for mobility (default value = 1e6 V/m) UEXP: Exponential coefficient for mobility (default value = 0) UTRA: Transverse field coefficient (default value = 0) VMAX: Maximum drift velocity of carriers (default value = 0 m/s) VMAX = 0: Frohman-Grove model of drain current computation VMAX > 0: Baum-Beneking model of drain current computation ECRIT: Critical electric field for pinch-off (default value = 0 V/m) Levels 2,3 XQC: Coefficient of channel charge share (default value = 0) Levels 2,3 XQC <= 0.5: Ward-Dutton model of gate capacitance computation XQC > 0.5: Meyer model of gate capacitance computation DELTA: Width effect on threshold voltage (default value = 0) KAPPA: Saturation field factor (default value = 0.2) ETA: Static feedback on threshold voltage (default value = 0) THETA: Mobility modulation (default value = 0 1/Volt) VBP: Gate to channel critical voltage (default value = 0 Volt) ISD: Drain junction saturation current at reference temperature (default value = 0 Amp) ISS: Source junction saturation current at reference temperature (default value = 0 Amp) PB: Built-in potential at reference temperature (default value = 0.8 Volt) CJ: Zero-bias bulk capacitance per square meter at reference temperature (default value = 1e-4 F/m2) MJ: Bulk junction grading coefficient (default value = 0.33) CJSW: Zero-bias perimeter capacitance per meter at reference temperature (default value = 1e-9 F/m) MJSW: Perimeter capacitance grading coefficient (default value = 0.33) FC: Forward-bias depletion capacitance coefficient (default value = 0.5) GminDC: Leakage conductance (default value = 1e-12 mho) EG: Energy gap for temperature effect on saturation current (default value = 1.11 Volt) EMin: if x < EMin, the exp(x) function is linearized (default value = -100) EMax: if x > EMax, the exp(x) function is linearized (default value = 40)
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